Method and system for scheduling tests in a parallel test system
US7543200B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 17, 2005 |
| Grant date | Jun 2, 2009 |
| Priority date | — |
| Expiry date | Feb 17, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31912
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An efficient and low-cost method for testing multiple DUTs in a parallel test system is disclosed. In one embodiment, a method for scheduling tests in a parallel test system having at least two devices-under-test (DUTs) coupled to a test controller through one or more vendor hardware modules includes receiving a test plan comprising a plurality of tests arranged in a predetermined test flow, where the predetermined test flow comprises a plurality of tests arranged in a directed graph and each test is arranged as a vertex in the directed graph, determining a test execution schedule in accordance with the test plan at runtime, where the test execution schedule identifies a set of next tests to be executed according to current states of the at least two DUTs and where the set of next tests include different tests to be performed on different DUTs, and testing the at least two DUTs using the test execution schedule.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.