Tandem type mass analysis system and method
US7544930B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2007 |
| Grant date | Jun 9, 2009 |
| Priority date | — |
| Expiry date | Dec 9, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/004
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively for each m/z region so as to obtain measurement MS2 data. By comparing the measurement MS2 data with reference MS2 data stored in a reference data base, a difference thereof is detected. For the m/z region with a differential component detected, the mass analysis is carried out collectively without dissociation for the all ions included therein so as to obtain measurement MS1 data. By comparing the measurement MS1 data with the reference MS1 data, a difference thereof is detected. From the difference thereof, a parent ion considered to be the differential component factor is presumed for carrying out the mass analysis with the same being dissociated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.