Kinya Kobayashi
24Patents
6h-index
32Co-inventors
65Inventor score
Filing activity: Apr 7, 2000 → Dec 9, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7473892B2 | Mass spectrometer system | Electricity | 40 | Active |
| US6745134B2 | Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system | Physics | 16 | Expired |
| US7595484B2 | Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program | Electricity | 11 | Expired |
| US6917037B2 | Mass spectrum analyzing system | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6511588B1 | Plating method using an additive | Electricity | 10 | Expired |
| US8482148B2 | Solar thermal power generation apparatus | Emerging Cross-Sectional Technologies | 6 | Active |
| US6914239B2 | System for analyzing mass spectrometric data | Electricity | 6 | Expired |
| US7180056B2 | Mass spectrometry and mass spectrometry system | Emerging Cross-Sectional Technologies | 5 | Expired |
| US6907352B2 | Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system | Physics | 5 | Expired |
| US7538321B2 | Method of identifying substances using mass spectrometry | Physics | 4 | Active |
| US7932486B2 | Mass spectrometer system | Electricity | 4 | Active |
| US6806098B2 | Method and device for assessing surface uniformity of semiconductor device treated by CMP | Performing Operations; Transporting | 3 | Expired |
| US7158893B2 | Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system | Physics | 3 | Expired |
| US7485852B2 | Mass analysis method and mass analysis apparatus | Physics | 3 | Active |
| US6926816B2 | Analysis method of film thickness distribution and design system of printed circuit board and manufacturing processes | Electricity | 3 | Expired |
| US6957159B2 | System for analyzing compound structure | Electricity | 2 | Expired |
| US8502425B2 | Totally enclosed motor | Electricity | 1 | Active |
| US7544930B2 | Tandem type mass analysis system and method | Electricity | 1 | Active |
| US9143025B2 | Magnetic gear mechanism including a plurality of rotors or stators | Electricity | 0 | Active |
| US7435949B2 | Mass spectrometric analysis method and system using the method | Electricity | 0 | Active |
| US10318679B2 | Calculation method of switching waveform of the inverter and circuit simulation model | Physics | 0 | Active |
| US7332713B2 | Mass spectrometric method and mass spectrometric system | Physics | 0 | Active |
| US9257259B2 | Electron beam irradiation method and scanning electronic microscope | Electricity | 0 | Active |
| US7126113B2 | Mass spectrometry system | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.