Patent · US Expired

Vapor deposition of tungsten nitride

US7560581B2 · kind B2 · utility

15Cited by
4References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 9, 2003
Grant dateJul 14, 2009
Priority date
Expiry dateSep 28, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/667
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Tungsten nitride films were deposited on heated substrates by the reaction of vapors of tungsten bis(alkylimide)bis(dialkylamide) and a Lewis base or a hydrogen plasma. For example, vapors of tungsten bis(tert-butylimide)bis(dimethylamide) and ammonia gas supplied in alternate doses to surfaces heated to 300° C. produced coatings of tungsten nitride having very uniform thickness and excellent step coverage in holes with aspect ratios up to at least 40:1. The films are metallic and good electrical conductors. Suitable applications in microelectronics include barriers to the diffusion of copper and electrodes for capacitors. Similar processes deposit molybdenum nitride, which is suitable for layers alternating with silicon in X-ray mirrors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.