High-resolution, low-distortion and high-efficiency optical coupling in detection system of electron beam apparatus
US7566873B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 2006 |
| Grant date | Jul 28, 2009 |
| Priority date | — |
| Expiry date | Mar 17, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/24592
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
One embodiment relates to an apparatus for inspecting a substrate using charged particles. The apparatus includes an illumination subsystem, an objective subsystem, a projection subsystem, and a beam separator interconnecting those subsystems. The apparatus further includes a detection system which includes a scintillating screen, a detector array, and an optical coupling apparatus positioned therebetween. The optical coupling apparatus includes both refractive and reflective elements. Other embodiments and features are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.