Patent · US Expired

Systems and methods for minimizing scattered light in multi-SLM maskless lithography

US7567368B2 · kind B2 · utility

2Cited by
22References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 6, 2005
Grant dateJul 28, 2009
Priority date
Expiry dateSep 29, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70941
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The present invention is directed to a lithography system in which scattered light from a pattern generator, having one or more pattern generating devices, is blocked from an object, such as a wafer or display. The system includes a pattern generator with multiple pattern generating devices, a projection system for directing light from the pattern generating device, and an aperture located at or near an object window. The aperture has a profile that matches the configuration of the pattern generating devices. A method for blocking scattered light in a lithography system using multiple pattern generating devices is also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.