Probe card layout
US7573276B2 · kind B2 · utility
0Cited by
9References
7Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 3, 2006 |
| Grant date | Aug 11, 2009 |
| Priority date | — |
| Expiry date | Nov 3, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06733
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Multi-touchdown, parallel test probe cards having probe elements arranged to provide greater than 99% efficiency during testing of a substrate having a plurality of die thereon, and methods of use.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.