John Caldwell
15Patents
5h-index
13Co-inventors
59Inventor score
Filing activity: Oct 17, 2000 → Aug 8, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8926606B2 | Integration of very short electric pulses for minimally to noninvasive electroporation | Human Necessities | 114 | Active |
| US8968542B2 | Devices and methods for contactless dielectrophoresis for cell or particle manipulation | Performing Operations; Transporting | 52 | Active |
| US7213330B2 | Method of fabricating an electronic device | Emerging Cross-Sectional Technologies | 8 | Expired |
| US6974330B2 | Electronic devices incorporating electrical interconnections with improved reliability and methods of fabricating same | Emerging Cross-Sectional Technologies | 7 | Expired |
| US6441606B1 | Dual zone wafer test apparatus | Physics | 5 | Expired |
| US7459923B2 | Probe interposers and methods of fabricating probe interposers | Emerging Cross-Sectional Technologies | 5 | Active |
| US7868630B2 | Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same | Emerging Cross-Sectional Technologies | 4 | Active |
| US10078066B2 | Devices and methods for contactless dielectrophoresis for cell or particle manipulation | Performing Operations; Transporting | 4 | Active |
| US7358517B2 | Method and apparatus for imager quality testing | Physics | 1 | Active |
| US11519877B2 | Devices and methods for contactless dielectrophoresis for cell or particle manipulation | Performing Operations; Transporting | 1 | Active |
| US7256595B2 | Test sockets, test systems, and methods for testing microfeature devices | Physics | 1 | Expired |
| US7884629B2 | Probe card layout | Physics | 0 | Active |
| US7573276B2 | Probe card layout | Physics | 0 | Active |
| US7122819B2 | Method and apparatus for imager die package quality testing | Physics | 0 | Expired |
| US8701686B2 | Flossing devices and methods of using same | Human Necessities | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.