One time programmable element system in an integrated circuit
US7573762B2 · kind B2 · utility
71Cited by
9References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2007 |
| Grant date | Aug 11, 2009 |
| Priority date | — |
| Expiry date | Jun 6, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C17/18
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system with a repairable memory array having redundant memory cells to replace one or more defective memory cells that are detected after fabrication. The system also includes non memory array circuits having circuitry that may adjust one or more operating parameters such as operating current, operating voltage, resistance, capacitance, timing characteristics and an operating mode. A set of one time programmable elements can be used to selectively store information for modifying operating parameters and replacing the defective memory cells with redundant memory cells.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.