Patent · US Active

Test apparatus and method for testing a circuit unit

US7574643B2 · kind B2 · utility

0Cited by

8References

8Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Stefan Gollmer · Birkenfeld, DE
Carsten Ohlhoff · Hersbruck, DE
Hans-Christoph Ostendorf · Munich, DE

Key dates

Filing date	Feb 17, 2006
Grant date	Aug 11, 2009
Priority date	—
Expiry date	May 7, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/5602
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

In a method for testing an electric circuit comprising circuit subunits, the electric circuit is connected to a test system via a tester channel with a connection unit. The tester channel is connected to the circuit subunits by means of a connecting unit, test signals are generated for the electric circuit and response signals generated by the electric circuit in response to the test signals are evaluated. The test signals and the response signals are interchanged between the circuit subunits by means of at least one compression/decompression unit associated with at least one of the circuit subunits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.