Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuit
US7577886B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 10, 2006 |
| Grant date | Aug 18, 2009 |
| Priority date | — |
| Expiry date | May 17, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318533
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electronic circuit comprises a plurality of configurable cells configured according to a chaining command signal. These configurable cells are configured either in a chained state in which the configurable cells are functionally connected in a chain to form a shift register, if the chaining command signal is in a first state, or in a functional state in which the configurable cells are functionally linked to logic cells with which they co-operate to form at least one logic circuit, if the mode command signal is in a second state. It is provided that a test data word will be preceded by a signature. The set formed by the digital signature and the data word forms a test sequence. The signature is verified before the introduction of the test data word by an appropriate detection circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.