Patent · US Active

Polishing composition for a tungsten-containing substrate

US7582127B2 · kind B2 · utility

18Cited by
23References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 1, 2007
Grant dateSep 1, 2009
Priority date
Expiry dateFeb 1, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/3212
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

The invention provides a method of chemically-mechanically polishing a substrate comprising tungsten through use of a composition comprising a tungsten etchant, an inhibitor of tungsten etching, and water, wherein the inhibitor of tungsten polishing is a polymer, copolymer, or polymer blend comprising at least one repeating group comprising at least one nitrogen-containing heterocyclic ring or a tertiary or quaternary nitrogen atom. The invention further provides a chemical-mechanical polishing composition particularly useful in polishing tungsten-containing substrates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.