Patent · US Active

Methods of fabricating transistors including supported gate electrodes

US7592211B2 · kind B2 · utility

97Cited by
130References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 17, 2006
Grant dateSep 22, 2009
Priority date
Expiry dateApr 19, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8503

Abstract

Transistors are fabricated by forming a protective layer having an opening extending therethrough on a substrate, and forming a gate electrode in the opening. A first portion of the gate electrode laterally extends on surface portions of the protective layer outside the opening, and a second portion of the gate electrode is spaced apart from the protective layer and laterally extends beyond the first portion. Related devices and fabrication methods are also discussed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.