Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program
US7595484B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 23, 2005 |
| Grant date | Sep 29, 2009 |
| Priority date | — |
| Expiry date | Feb 24, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0031
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention can provide a mass spectrometric system judging whether a measurement target is a substance required by an operator within an actual measurement time, when a substance (particularly such as protein or sugar chains) is analyzed. In the mass spectrometric system using a tandem mass spectrometer, a particular substance obtained by separating a sample is ionized, and mass analysis of the ionized substance is performed to obtain a spectrum. This spectrum is compared with a particular spectrum stored in advance, to thereby determine whether both the spectra match with each other. When a match is determined, a particular ion is further ionized within a particular time for detailed analysis. The invention also provides a mass spectrometric method, a diagnosis system and an inspection system each using the mass spectrometric system, and a program for operating a computer to control those systems with desired functions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.