Ranged fault signatures for fault diagnosis
US7596718B2 · kind B2 · utility
17Cited by
11References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 4, 2007 |
| Grant date | Sep 29, 2009 |
| Priority date | — |
| Expiry date | May 4, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0281
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method and apparatus for diagnosing faults. A fault is detected. One or more process variables that contributed to the fault are determined. A relative contribution of each of the one or more process variables is determined. A determination is made as to which fault signatures match the fault, a match occurring when the relative contributions of the one or more process variables are within relative contribution ranges of the matching fault signature. Each fault signature is associated with at least one fault class.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.