Patent · US Expired

Plasma processing apparatus and plasma processing method

US7601241B2 · kind B2 · utility

7Cited by
3References
11Claims
0Family size

Assignees

Inventors

Key dates

Filing dateFeb 24, 2004
Grant dateOct 13, 2009
Priority date
Expiry dateMar 28, 2026

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23F4/00
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus having 90% or more of a side wall of an inner wall 101 of a reaction chamber 1 covered with a dielectric 102, and equipped with an earthed conductive member 21a having an area of less than 10% of the side wall area of the inner wall 101 and having a structure to allow direct current from a plasma to flow therein, wherein the DC earth formed of the conductive member 21 is located at a position where floating potential of plasma (or plasma density) is higher than the floating potential of plasma 9 located near a wafer holding electrode 14 where there is relatively large wall chipping.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.