High throughput multi beam detection system and method
US7601944B2 · kind B2 · utility
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Key dates
| Filing date | Dec 20, 2007 |
| Grant date | Oct 13, 2009 |
| Priority date | — |
| Expiry date | Dec 20, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8806
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for inspecting an article, the system includes a spatial filter that is shaped such as to direct output beams towards predefined locations and an optical beam directing entity, for directing the multiple output beams toward multiple detector arrays. The method includes spatially filtering multiple input light beams to provide substantially aberration free output light beams; and directing the multiple output beams by an optical beam directing entity, toward multiple detector arrays.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.