Applied Materials Israel Ltd.
530Patents
450Active
530Granted
61Portfolio score
Filing activity: Feb 21, 2002 → Sep 13, 2023 · 83 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7217579B2 | Voltage contrast test structure | Physics | 88 | Expired |
| US7244949B2 | Particle-optical systems and arrangements and particle-optical components for such systems and arrangements | Electricity | 85 | Expired |
| US7902849B2 | Apparatus and method for test structure inspection | Physics | 79 | Active |
| US7468506B2 | Spot grid array scanning system | Physics | 53 | Expired |
| US7759642B2 | Pattern invariant focusing of a charged particle beam | Electricity | 49 | Active |
| US7135344B2 | Design-based monitoring | Physics | 47 | Expired |
| US6899765B2 | Chamber elements defining a movable internal chamber | Emerging Cross-Sectional Technologies | 38 | Expired |
| US7842933B2 | System and method for measuring overlay errors | Electricity | 38 | Expired |
| US7696497B2 | Focusing system and method for a charged particle imaging system | Electricity | 38 | Expired |
| US9153413B2 | Multi-beam scanning electron beam device and methods of using the same | Electricity | 37 | Active |
| US7468507B2 | Optical spot grid array scanning system | Physics | 29 | Expired |
| US9263233B2 | Charged particle multi-beam inspection system and method of operating the same | Electricity | 28 | Active |
| US9336981B2 | Charged particle detection system and multi-beamlet inspection system | Electricity | 27 | Active |
| US7504622B2 | High throughput multi beam detection system and method | Electricity | 26 | Active |
| US9653254B2 | Particle-optical systems and arrangements and particle-optical components for such systems and arrangements | Electricity | 24 | Active |
| US8709269B2 | Method and system for imaging a cross section of a specimen | Physics | 24 | Active |
| US7535001B2 | Method and system for focusing a charged particle beam | Electricity | 23 | Active |
| US7375326B2 | Method and system for focusing a charged particle beam | Electricity | 23 | Active |
| US10541112B2 | Charged particle beam system and method of operating the same | Electricity | 22 | Active |
| US9530613B2 | Focusing a charged particle system | Electricity | 22 | Active |
| US7619203B2 | High throughput multi beam detection system and method | Physics | 22 | Active |
| US9702983B2 | Multi-spot collection optics | Electricity | 22 | Active |
| US8315453B2 | Defect classification with optimized purity | Physics | 22 | Active |
| US7285779B2 | Methods of scanning an object that includes multiple regions of interest using an array of scanning beams | Electricity | 22 | Expired |
| US10354831B2 | Charged particle inspection method and charged particle system | Electricity | 22 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.