Emanuel Elyasaf
19Patents
9h-index
20Co-inventors
68Inventor score
Filing activity: Apr 16, 1997 → Nov 17, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6268093A | Method for reticle inspection using aerial imaging | Physics | 131 | Expired |
| US6175645A | Optical inspection method and apparatus | Physics | 107 | Expired |
| US5892579A | Optical inspection method and apparatus | Physics | 57 | Expired |
| US7133548B2 | Method and apparatus for reticle inspection using aerial imaging | Physics | 44 | Expired |
| US7504622B2 | High throughput multi beam detection system and method | Electricity | 26 | Active |
| US7619203B2 | High throughput multi beam detection system and method | Physics | 22 | Active |
| US7355690B2 | Double inspection of reticle or wafer | Physics | 18 | Expired |
| US6798505B2 | Method and apparatus for article inspection including speckle reduction | Physics | 13 | Expired |
| US6809808B2 | Wafer defect detection system with traveling lens multi-beam scanner | Physics | 13 | Expired |
| US7053395B2 | Wafer defect detection system with traveling lens multi-beam scanner | Physics | 8 | Expired |
| US7187439B2 | High throughput inspection system and method for generating transmitted and/or reflected images | Physics | 7 | Expired |
| US6853475B2 | Wafer defect detection system with traveling lens multi-beam scanner | Physics | 6 | Expired |
| US6930770B2 | High throughput inspection system and method for generating transmitted and/or reflected images | Physics | 4 | Expired |
| US9699835B2 | Machine readable element and optical indicium for authenticating an item before processing | Electricity | 3 | Active |
| US7326901B2 | High throughput multi beam system and method | Physics | 0 | Expired |
| US7400390B2 | Inspection system and a method for aerial reticle inspection | Physics | 0 | Expired |
| US7518718B2 | High throughput inspection system and a method for generating transmitted and/or reflected images | Physics | 0 | Active |
| US7601944B2 | High throughput multi beam detection system and method | Physics | 0 | Active |
| US7841529B2 | Multiple optical head inspection system and a method for imaging an article | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.