Probe and probe card
US7602203B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 1, 2006 |
| Grant date | Oct 13, 2009 |
| Priority date | — |
| Expiry date | Mar 1, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06716
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An object of the present invention is to make it possible that a probe for testing electrical characteristics of an object to be tested is easily attached to a support member such as a contactor. A through hole is formed in the contactor. In the probe, a fitting/locking portion which can be fitted in this through hole is formed. The fitting/locking portion is formed to penetrate the through hole of the contactor and to be locked in the contactor in a state that a tip thereof is in contact with a connecting terminal of a printed wiring board. The fitting/locking portion itself is locked in the contactor by hooking a locking portion thereof to an end face on an upper side of the through hole.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.