Kiyoshi Takekoshi
26Patents
8h-index
19Co-inventors
72Inventor score
Filing activity: Oct 21, 1988 → Nov 5, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6501289B1 | Inspection stage including a plurality of Z shafts, and inspection apparatus | Physics | 89 | Expired |
| US4896869A | Moving table apparatus | Performing Operations; Transporting | 49 | Expired |
| US6672876B1 | Probe card with pyramid shaped thin film contacts | Electricity | 37 | Expired |
| US6359455B1 | Probing card | Physics | 37 | Expired |
| US5801545A | LCD testing apparatus | Physics | 29 | Expired |
| US5691764A | Apparatus for examining target objects such as LCD panels | Physics | 28 | Expired |
| US7091733B2 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Physics | 17 | Expired |
| US6590381B1 | Contactor holding mechanism and automatic change mechanism for contactor | Physics | 11 | Expired |
| US6777967B2 | Inspection method and inspection apparatus | Physics | 7 | Expired |
| US6024629A | Probe apparatus and a method for polishing a probe | Physics | 7 | Expired |
| US6583614B2 | Inspection stage and inspection apparatus having a plurality of Z axes | Physics | 6 | Expired |
| US8101436B2 | Dicing method, method of inspecting integrated circuit element, substrate holding device, and pressure sensitive adhesive film | Electricity | 6 | Active |
| US6707310B2 | Needle load measuring method, needle load setting method and needle load detecting mechanism | Emerging Cross-Sectional Technologies | 5 | Expired |
| US7256592B2 | Probe with trapezoidal contractor and device based on application thereof, and method of producing them | Emerging Cross-Sectional Technologies | 5 | Expired |
| US7602203B2 | Probe and probe card | Physics | 4 | Expired |
| US4941800A | Transfer apparatus for plate-like member | Electricity | 3 | Expired |
| US7242206B2 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Physics | 3 | Expired |
| US7621045B2 | Method of producing a probe with a trapezoidal contactor | Emerging Cross-Sectional Technologies | 3 | Active |
| US6774621B2 | Inspection stage having a plurality of Z axes | Physics | 2 | Expired |
| US7061259B2 | Inspection method and inspection apparatus | Physics | 2 | Expired |
| US7221176B2 | Vacuum prober and vacuum probe method | Physics | 2 | Expired |
| US7716824B2 | Method of manufacturing a probe card | Emerging Cross-Sectional Technologies | 1 | Active |
| US8456186B2 | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method | Physics | 1 | Active |
| US8120372B2 | Probe card for inspecting light receiving device | Physics | 1 | Active |
| US7304489B2 | Inspection method and inspection apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.