Spatial wavefront analysis and 3D measurement
US7609388B2 · kind B2 · utility
17Cited by
25References
74Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 16, 2002 |
| Grant date | Oct 27, 2009 |
| Priority date | — |
| Expiry date | May 24, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B7/24088
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.