Patent · US Active

Photoresist coating composition and method for forming fine pattern using the same

US7615338B2 · kind B2 · utility

1Cited by
8References
21Claims
0Family size

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Key dates

Filing dateDec 8, 2005
Grant dateNov 10, 2009
Priority date
Expiry dateOct 11, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/40
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A photoresist coating composition that includes a compound represented by Formula 1 and an aqueous solvent, and a method for forming a fine pattern by coating the composition on a photoresist pattern to effectively reduce a size of a photoresist contact hole and a space, which can be applied to all semiconductor processes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.