Patent · US Active

High throughput multi beam detection system and method

US7619203B2 · kind B2 · utility

22Cited by
5References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 19, 2007
Grant dateNov 17, 2009
Priority date
Expiry dateDec 19, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/8806
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method for inspecting an article, the system includes a spatial filter that is shaped such as to direct output beams towards predefined locations and an optical beam directing entity, for directing the multiple output beams toward multiple detector arrays. The method includes spatially filtering multiple input light beams to provide substantially aberration free output light beams; and directing the multiple output beams by an optical beam directing entity, toward multiple detector arrays.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.