Patent · US Active

CMP apparatuses with polishing assemblies that provide for the passive removal of slurry

US7632170B2 · kind B2 · utility

7Cited by
7References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 25, 2007
Grant dateDec 15, 2009
Priority date
Expiry dateJun 25, 2027

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/26
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Chemical mechanical planarization apparatuses with polishing assemblies that provide for the passive removal of slurry are provided. In accordance with an embodiment, a work piece polishing assembly comprises a polishing pad comprising a polishing surface and an exhaust aperture that extends through the polishing pad from the polishing surface and is configured to receive a slurry from the polishing surface. An underlying member is disposed underlying the polishing pad and comprises a peripheral surface. The underlying member comprises a channel that is in fluid communication with the aperture and that opens at the peripheral surface of the underlying member.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.