Efficient storage of fail data to aid in fault isolation
US7634127B1 · kind B1 · utility
4Cited by
15References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2004 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Apr 17, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for fault isolation in semiconductor with devices thereon includes determining test data from a plurality of semiconductor devices and creating a failure bitmap of locations of the plurality of semiconductor devices and test data in a vector graphic CAD format. The vector graphic CAD format allows storage of test data on multiple layers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.