Patent · US Active

System and method for voltage noise and jitter measurement using time-resolved emission

US7679358B2 · kind B2 · utility

7Cited by

7References

13Claims

0Family size

Assignee

DCG Systems, Inc. · US

Inventors

Steven Kasapi · San Francisco, US
Gary Woods · Sunnyvale, US

Key dates

Filing date	Apr 5, 2007
Grant date	Mar 16, 2010
Priority date	—
Expiry date	Dec 26, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31725
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Time-resolved emission can be used to measure loop-synchronous, small-signal voltage perturbation in integrated circuits. In this technique the measurements are completely non-invasive and so reflect the true device behavior. The time-dependant propagation delay caused by Vdd modulation also shows the expected qualitative signature. This technique should find applications in circuits with relatively fast clock-like circuits where loop-synchronous voltage pickup is limiting circuit behavior.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.