Method and apparatus for bandwidth measurement and bandwidth parameter calculation for laser light
US7684046B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 8, 2007 |
| Grant date | Mar 23, 2010 |
| Priority date | — |
| Expiry date | Sep 17, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/45
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A bandwidth meter method and apparatus for measuring the bandwidth of a spectrum of light emitted from a laser input to the bandwidth meter is disclosed, which may comprise an optical bandwidth monitor providing a first output representative of a first parameter which is indicative of the bandwidth of the light emitted from the laser and a second output representative of a second parameter which is indicative of the bandwidth of the light emitted from the laser; and, an actual bandwidth calculation apparatus utilizing the first output and the second output as part of a multivariable equation employing predetermined calibration variables specific to the optical bandwidth monitor, to calculate an actual bandwidth parameter. The actual bandwidth parameter may comprise a spectrum full width at some percent of the maximum within the full width of the spectrum of light emitted from the laser or a width between two points on the spectrum enclosing some percentage of the energy of the full spectrum of the spectrum of light emitted from the laser. The apparatus and method may be implemented in a laser lithography light source and/or in an integrated circuit lithography tool.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.