Trench MOSFET and method of manufacture utilizing four masks
US7687352B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 2, 2007 |
| Grant date | Mar 30, 2010 |
| Priority date | — |
| Expiry date | Feb 27, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/62
Abstract
In accordance with the invention, a trench MOSFET semiconductor device is manufactured in accordance with a process comprising the steps of: providing a heavily doped N+ silicon substrate; utilizing a first mask to define openings for the trench gate and termination; utilizing a second mask as a source mask with openings determining the size and shape of a diffused source junction depth; utilizing a third mask as a contact mask to define contact hole openings; and utilizing a fourth mask as a metal mask, whereby only the first, second, third and fourth masks are utilized in the manufacture of the trench MOSFET semiconductor device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.