Patent · US Active

CMOS-compatible non-volatile memory cell with lateral inter-poly programming layer

US7688639B1 · kind B1 · utility

0Cited by
4References
9Claims
0Family size

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Key dates

Filing dateOct 12, 2007
Grant dateMar 30, 2010
Priority date
Expiry dateOct 12, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/0466
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An electrically erasable programmable read-only memory (“CMOS NON-VOLATILE MEMORY”) cell is fabricated using standard CMOS fabrication processes. First and second polysilicon gates are patterned over an active area of the cell between source and drain regions. Thermal oxide is grown on the polysilicon gates to provide an isolating layer. Silicon nitride is deposited between the first and second polysilicon gates to form a lateral programming layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.