Patent · US Active

Integrated circuit comprising a test mode secured by detection of the state of a control signal

US7694197B2 · kind B2 · utility

2Cited by

5References

25Claims

0Family size

Assignee

STMicroelectronics SA

Inventors

Frederic Bancel · Lamanon, FR
David Hely · Les Pennes-Mirabeau, FR

Key dates

Filing date	Jul 10, 2006
Grant date	Apr 6, 2010
Priority date	—
Expiry date	Aug 27, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318533
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An electronic circuit comprises configurable cells driven by command signals to adopt either a standard mode of operation in which they are integrated into a logic circuit, or a test mode in which they provide information on this logic circuit. The circuit includes a spy circuit capable of detecting an abnormal excitation of certain of the conductors through which the command signals travel, thus preventing fraudulent extraction of data out of the configurable cells. The spy circuit includes a logic combination circuit and a state detection cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.