Integrated circuits; method for manufacturing an integrated circuit; method for decreasing the influence of magnetic fields; memory module
US7697322B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 10, 2007 |
| Grant date | Apr 13, 2010 |
| Priority date | — |
| Expiry date | Mar 25, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N50/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the invention relate generally to integrated circuits, to a method for manufacturing an integrated circuit, to a method for decreasing the influence of magnetic fields, and to a memory module. In an embodiment of the invention, an integrated circuit having a magnetic tunnel junction is provided. The magnetic tunnel junction may include a free layer with a magnetization orientation that is selected by the application of a write current through the magnetic tunnel junction, and a retention layer that retains the selectable magnetization orientation of the free layer at temperatures below a retention temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.