Method of testing a non-volatile memory device
US7697341B2 · kind B2 · utility
5Cited by
2References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 11, 2008 |
| Grant date | Apr 13, 2010 |
| Priority date | — |
| Expiry date | Sep 11, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of testing a non-volatile memory device on a wafer is disclosed. The method includes performing an erase operation and a first verify operation about every memory cell in the non-volatile memory device, storing data of a first latch in a page buffer for storing result in accordance with the first verify operation in a second latch, and setting the data of the first latch to data indicating pass of the verifying, and performing a soft program and a second verify operation about every memory cell.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.