Jae Won Cha
35Patents
6h-index
27Co-inventors
65Inventor score
Filing activity: Nov 1, 2004 → Nov 16, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7243994B2 | Continuously operable seat-reclining device for vehicles | Performing Operations; Transporting | 16 | Expired |
| US7195318B2 | Reclining device of vehicle seat | Performing Operations; Transporting | 16 | Expired |
| US10002652B1 | Memory system and method for operating the same | Physics | 9 | Active |
| US7800955B2 | Programming method of a non-volatile memory device | Physics | 7 | Active |
| US7310275B2 | Non-volatile memory device and method for operation page buffer thereof | Physics | 7 | Expired |
| US7688667B2 | Voltage converter circuit and flash memory device having the same | Physics | 6 | Active |
| US7787299B2 | Semiconductor memory device and erase method in the same | Physics | 5 | Active |
| US7697341B2 | Method of testing a non-volatile memory device | Physics | 5 | Active |
| US8812777B2 | Nonvolatile memory device | Physics | 4 | Active |
| US7830717B2 | Method for performing erasing operation in nonvolatile memory device | Physics | 4 | Active |
| US7684242B2 | Flash memory device and method of operating the same | Physics | 4 | Active |
| US7813188B2 | Non-volatile memory device and a method of programming a multi level cell in the same | Physics | 3 | Active |
| US7515477B2 | Non-volatile memory device and method of programming the same | Physics | 3 | Active |
| US8102717B2 | Method of testing for a leakage current between bit lines of nonvolatile memory device | Physics | 3 | Active |
| US8902674B2 | Semiconductor memory device and method of reading out the same | Physics | 3 | Active |
| US7623403B2 | NAND flash memory device and method of operating the same | Physics | 3 | Active |
| US7948805B2 | Method of programming a multi level cell | Physics | 2 | Active |
| US7782667B2 | Method of operating a flash memory device | Physics | 2 | Active |
| US8885419B2 | Semiconductor memory device and methods of operating the same | Physics | 2 | Active |
| US8335118B2 | Method of operating a flash memory device | Physics | 2 | Active |
| US8159883B2 | Semiconductor memory device having a block decoder for preventing disturbance from unselected memory blocks | Physics | 2 | Active |
| US9343161B2 | Semiconductor memory device and methods of operating the same | Physics | 1 | Active |
| US8004914B2 | Method of testing nonvolatile memory device | Physics | 1 | Active |
| US10163523B2 | Semiconductor device and operating method thereof | Physics | 1 | Active |
| US8218368B2 | Semiconductor memory device and erase method in the same | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.