Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
US7700381B2 · kind B2 · utility
7Cited by
17References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 9, 2006 |
| Grant date | Apr 20, 2010 |
| Priority date | — |
| Expiry date | Apr 29, 2027 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/974
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor wafer has a bevel contour formed along the periphery thereof, products formed on the wafer, and an ID mark formed on the bevel contour. The ID mark shows at least the properties, manufacturing conditions, and test results of the products.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.