Patent · US Expired

Method and zone for sealing between two microstructure substrates

US7700457B2 · kind B2 · utility

1Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 17, 2002
Grant dateApr 20, 2010
Priority date
Expiry dateOct 9, 2025

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81B7/0077
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

The invention concerns a sealing zone between two microstructure substrates. Said sealing zone comprises at least the following parts: on a first wafer level (20), a lower edging (22A) made of an adhesive material capable of causing the first substrate (20) to adhere to a sealing material, said sealing material being adapted to spontaneously diffuse jointly with the material of the second wafer level (30); on said lower edging (22A), a layer of said sealing material; and on said layer of sealing material, a protuberance (36) formed on said second wafer level (30) containing a certain amount of sealing material. The invention is applicable to microstructures comprising vacuum-operated components.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.