Patent · US Active

Deep trench isolation for power semiconductors

US7723800B2 · kind B2 · utility

13Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 23, 2008
Grant dateMay 25, 2010
Priority date
Expiry dateAug 7, 2028

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/104
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An integrated power semiconductor device has an isolation structure having two or more isolation trenches, and one or more regions in between the isolation trenches, and a bias arrangement coupled to the regions to divide a voltage across the isolation structure between the isolation trenches. By dividing the voltage, the reverse breakdown voltage characteristics such as voltage level, reliability and stability can be improved for a given area of device, or for a given complexity of device, and avalanche breakdown at weaknesses in isolation structures can be reduced or avoided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.