Patent · US Active

Step and repeat imprint lithography processes

US7727453B2 · kind B2 · utility

11Cited by
189References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 11, 2005
Grant dateJun 1, 2010
Priority date
Expiry dateJun 22, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/0002
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

The present invention is directed to a method of forming a layer on a region of a substrate, the method including, inter alia, positioning a liquid on the substrate; and contacting the liquid with the mold, defining a gap between the mold and the substrate, with the gap enabling positioning of the liquid by capillary forces to generate the layer over the region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.