Patent · US Active

Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design

US7752589B2 · kind B2 · utility

0Cited by

5References

32Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Robert J. Allen · South Harwich, US
Sarah C. Braasch · South Burlington, US
Matthew T. Guzowski · South Burlington, US
Jason D. Hibbeler · Williston, US
Daniel N. Maynard · Craftsbury Common, US
Kevin W. McCullen · South Burlington, US
Evanthia Papadopoulou · Baldwin Place, US
Mervyn Y. Tan · Colchester, US
Robert F. Walker · South Burlington, US

Key dates

Filing date	Jan 5, 2007
Grant date	Jul 6, 2010
Priority date	—
Expiry date	Sep 24, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/39
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method, apparatus, and computer program product for visually indicating the interaction between one or more edges of a design that contribute to a defined critical area pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.