Patent · US Active

Differential signal probing system

US7764072B2 · kind B2 · utility

15Cited by

1,014References

26Claims

0Family size

Assignee

Cascade Microtech, Inc. · US

Inventors

Eric W. Strid · Portland, US
Richard Campbell · Medicine Hat, CA

Key dates

Filing date	Feb 22, 2007
Grant date	Jul 27, 2010
Priority date	—
Expiry date	Feb 22, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06772
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.