Patent · US Expired

Methods for distribution of test generation programs

US7765450B2 · kind B2 · utility

1Cited by
20References
8Claims
0Family size

Inventors

Key dates

Filing dateOct 20, 2005
Grant dateJul 27, 2010
Priority date
Expiry dateJan 19, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31707
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

As described herein, circuit testing algorithms, or portions thereof, can be executed in a distributed manner so that their execution can be over a network of processors. In one aspect, the results that are obtained by such distributed execution are ensured to be consistent with the results that would be obtained by executing them in a non-distributed manner. Thus, in one aspect, the algorithms, or portions thereof, have to be made distributable. The algorithms, or portions thereof, are made distributable by isolating any random number generation therewith to be independent of each other. This isolation applies to any random number generation associated with different call instances of the same algorithm as well. In one aspect, the isolation is accomplished by ensuring that the calculation of random number sequences for the algorithms, or portions thereof, is not dependent on random number sequences calculated for the others or between call instances of the same algorithm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.