Dynamically reconfigurable shared scan-in test architecture

US7774663B2 · kind B2 · utility

Assignee

• SYNOPSYS, INC. · US

Inventors

• Rohit Kapur · Cupertino, US
• Nodari Sitchinava · San Mateo, US
• Samitha Samaranayake · San Mateo, US
• Emil Gizdarski · Cupertino, US
• Frederic J. Neuveux · Meylan, FR
• Suryanarayana Duggirala · San Jose, US
• Thomas W. Williams · Boulder, US

Key dates

• Filing date: Jul 9, 2009
• Grant date: Aug 10, 2010
• Expiry date: Jul 9, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318536
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.