Patent · US Active

Memory with dynamic redundancy configuration

US7778070B2 · kind B2 · utility

10Cited by

3References

9Claims

0Family size

Assignee

Qimonda AG · DE

Inventors

Thomas Nirschl · Putzbrunn, DE
Thomas Happ · Tarrytown, US
Jan Boris Philipp · Peekskill, US

Key dates

Filing date	May 15, 2008
Grant date	Aug 17, 2010
Priority date	—
Expiry date	Oct 6, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG11C2213/32
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

One embodiment of the invention relates to a method for repairing a memory array. In the method, a group of at least one memory cell is dynamically analyzed to determine whether the memory array includes at least one faulty cell that no longer properly stores data. If the group includes at least one faulty cell, at least the at least one faulty cell is associated with at least another cell. Other methods, devices, and systems are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.