Identifying sequential functional paths for IC testing methods and system
US7784000B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2008 |
| Grant date | Aug 24, 2010 |
| Priority date | — |
| Expiry date | Jul 22, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31858
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system of identifying sequential functional paths for IC testing methods are disclosed. In one embodiment, a method may include a method of sequential functional path identification for at-speed structural test, the method comprising: using a timing tool to enumerate a plurality of critical paths in a circuit; identifying which of the plurality of critical paths are sequential functional paths that will function during functional operation of the IC by identifying which of the plurality of critical paths a test can be generated for using a test sequence having n functional capture cycles, where n is greater than 2; performing path test generation for the sequential functional paths using launch-off-scan test sequences; and performing path test generation for critical paths not tested by the launch-of-scan test sequences, using launch-off-capture test sequences having two functional captures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.