Infrared sensor and method of calibrating the same
US7795589B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 2008 |
| Grant date | Sep 14, 2010 |
| Priority date | — |
| Expiry date | Dec 17, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG12B13/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes determining a transmission of a transmissive window and a transmission of a transmissive fluid. In addition, an infrared emission of the transmissive window is determined along with an infrared emission of the transmissive fluid for at least one temperature. In a system that has an infrared sensor and an optical pathway to the infrared sensor, the transmissive window and the transmissive fluid are placed in the optical pathway. A semiconductor chip is placed in the optical pathway proximate the transmissive fluid. Radiation from the optical pathway is measured with the infrared sensor. An emissivity of the semiconductor chip is determined using the measured radiation and the determined transmissions and emissions of the transmissive window and the transmissive fluid.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.