Method and apparatus for extracting assume properties from a constrained random test-bench
US7797123B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2008 |
| Grant date | Sep 14, 2010 |
| Priority date | — |
| Expiry date | Jul 2, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/3323
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One embodiment of the present invention provides systems and techniques to extract assume properties from a constrained random test-bench. During operation, the system can receive a constrained random test-bench for verifying the design-under-test (DUT), wherein the constrained random test-bench includes a statement which assigns a random value to a random variable according to a constraint. Next, the system can modify the constrained random test-bench by replacing the statement with another statement which assigns a free input variable's value to the random variable. The system can also add a statement to the constrained random test-bench that toggles a marker variable to localize the scope of the statement. The system can then generate an assume property which models the constraint on the free input variable. The assume property can then be used by a formal property verification tool to verify the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.