Test apparatus for regulating a test signal supplied to a device under test and method thereof
US7805641B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2007 |
| Grant date | Sep 28, 2010 |
| Priority date | — |
| Expiry date | Jul 30, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test apparatus tests a device under test. The test apparatus includes a period generator that generates a rate signal determining a test period according to an operating period of the device under test, a phase comparing section that inputs an operational clock signal for the device under test generated from the device under test and detects a phase difference between the operational clock signal and the rate signal using the rate signal as a standard, a test signal generating section that generates a test signal to be supplied to the device under test in synchronization with the rate signal, a delaying section that delays the test signal in accordance with the phase difference to substantially synchronize the delayed signal with the operational clock signal, and a test signal supplying section that supplies the delayed test signal to the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.