Patent · US Expired

Electrical diagnostic circuit and method for the testing and/or the diagnostic analysis of an integrated circuit

US7814384B2 · kind B2 · utility

1Cited by

13References

40Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Michael Goessel · Roter Dudel, DE
Andreas Leininger · Birkenfeld, DE

Key dates

Filing date	Aug 11, 2004
Grant date	Oct 12, 2010
Priority date	—
Expiry date	Apr 1, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318547
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An electrical diagnostic circuit and testing method is disclosed. In one embodiment, the electrical diagnostic circuit for testing an integrated circuit includes a number of external inputs, a plurality of essentially similar, series-connected switching units and a circuit output. The switching units are constructed to be controllable in such a manner that an input signal present at the internal input of the switching unit, in dependence on a control signal of the switching unit, can either be forwarded unchanged to the internal input of the switching unit in each case arranged downstream, or can be combined with the test signal in each case present at the external input.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.