Inventor · Birkenfeld, DE

Andreas Leininger

4Patents
2h-index
5Co-inventors
33Inventor score

Filing activity: Aug 11, 2004 → Feb 22, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US8312332B2 Device and method for testing and for diagnosing digital circuits Physics 3 Active
US8060800B2 Evaluation circuit and method for detecting and/or locating faulty data words in a data stream Tn Physics 2 Expired
US9619318B2 Memory circuits, method for accessing a memory and method for repairing a memory Electricity 2 Active
US7814384B2 Electrical diagnostic circuit and method for the testing and/or the diagnostic analysis of an integrated circuit Physics 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.