Patent · US Active

Transistor with improved tip profile and method of manufacture thereof

US7821044B2 · kind B2 · utility

30Cited by
1References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 15, 2008
Grant dateOct 26, 2010
Priority date
Expiry dateJan 15, 2028

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/822
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments are an improved transistor structure and the method of fabricating the structure. In particular, a wet etch of an embodiment forms source and drain regions with an improved tip shape to improve the performance of the transistor by improving control of short channel effects, increasing the saturation current, improving control of the metallurgical gate length, increasing carrier mobility, and decreasing contact resistance at the interface between the source and drain and the silicide.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.